<p class="AbstractText"><span lang="EN-US">The present study suggests that the amplitude of the error-related negativity (Ne/ERN) potential can be modified by over-learning and by correct/incorrect response feedback. 32 female Mexican college students, ages between 18 and 24, were recruited to participate. Previously to the electroencephalographic (EEG) recordings, participants were divided for training into 4 groups and were exposed to a) over-learning and correct response feedback learning; b) over-learning and incorrect response feedback learning; c) correct response feedback learning without over-learning and d) incorrect response feedback learning without over-learning. During EEG recording, participants were asked to press the key that matched a previously presented stimulus (“X”/“+”). Greater negativity in Ne/ERN amplitude was found during over-learning conditions compared to conditions without over-learning. Similar results were found in the over-learning/correct response feedback phase as opposed to the incorrect response without over-learning condition.</span></p>